久久伊人五月丁香狠狠色,人妻少妇精品视频一区二区三区,AV无码AV高潮AV喷吹免费,男JI大巴进入女人的视频小说

SEM (scanning electron microscope)

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) utilizes a focused electron beam across a sample surface, to provide high-resolution and long-depth-of-field images of the sample surface. SEM is one of the most widely used analytical tools in industry due to the extremely detailed images it can provide. Coupled to an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector, this technique also offers elemental identification of nearly the entire periodic table.

 

SEM Technical Capabilities

Signal Detected:
Secondary & backscattered electrons and x-rays

Elements Detected:
B-U (EDS mode)

Detection Limits:
0.1 - 1 at%

Depth Resolution:
0.5 - 3 µm (EDS)

Imaging/Mapping:
Yes

Lateral Resolution/Probe Size:
15 - 45 Angstrom

 

Ideal Uses for SEM Analysis

  • High resolution images
  • Elemental microanalysis and particle characterization

 

Relevant Industries for SEM Analysis

  • Aerospace
  • Automotive
  • Biomedical/biotechnology
  • Compound Semiconductor
  • Data Storage
  • Defense
  • Displays
  • Electronics
  • Industrial Products
  • Lighting
  • Pharmaceutical
  • Photonics
  • Polymer
  • Semiconductor
  • Solar Photovoltaics
  • Telecommunications

 

Strengths of SEM Analysis

  • Rapid, high-resolution imaging
  • Quick identification of elements present
  • Good depth of field
  • Versatile platform that supports many other tools

 

Limitations of SEM Analysis

  • Vacuum compatibility typically required
  • May  need to etch for contrast
  • SEM may spoil sample for subsequent analyses
  • Size restrictions may require cutting the sample
  • Ultimate resolution is a strong function of the sample and preparation
 

Copyright © 2010 cyu-china.com.cn All Rights Reserved .  
成人免费无码大片A毛片| 中日韩VA无码中文字幕| 日韩精品无码一本二本三本| 少妇高潮惨叫久久久久电影69| 女人扒开屁股爽桶30分钟| 亚洲熟妇无码另类久久久|